Suwon-si, South Korea

Daeil Yu

This inventor holds 1 USPTO granted patent. Top assignee: Samsung Electronics Co., Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Daeil Yu. Retrieved from https://idiyas.com/inventor/daeil-yu-caif3vwy

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Daeil Yu: Camera-Module Inventor

Introduction

Daeil Yu is an inventor based in Suwon-si, South Korea, whose patent work includes camera-module technology for calibrating image data. He is associated with Samsung Electronics Ltd.

Latest Patents

Yu is credited with 1 patent: “Camera Module for Calibrating Image Data, Operating Method of Camera Module, and Electronic Device Including Camera Module.” The invention describes a camera module with an image sensor that captures raw image data from a display or the exterior, and control logic that processes those data.

In a first operating mode, the control logic disables image-sensor calibration and uses raw data captured from the display to generate crosstalk calibration data. In a second mode, it enables calibration and generates image data from raw data based on light from both the display and the exterior. The approach is designed to support image capture while accounting for crosstalk.

Career Highlights

Yu’s listed patent reflects work on camera systems, image sensors, and image-data processing. His association with Samsung Electronics Ltd. connects his inventive work with a company active in electronics and imaging technologies.

Collaborations

Yu’s listed coworkers include Sung-Ho Cha and Kundong Kim. Their names are associated with his professional and patent-related context.

Conclusion

Daeil Yu’s patent describes a camera-module calibration method that uses distinct operating modes to generate crosstalk calibration data and process image data.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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