Seoul, South Korea

Dae Ung Yoon

This inventor holds 1 USPTO granted patent. Top assignee: Industry-University Cooperation Foundation Hanyang University. Active years: 2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Dae Ung Yoon. Retrieved from https://idiyas.com/inventor/dae-ung-yoon

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2024

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1 patent (USPTO):Explore Patents

Title: Dae Ung Yoon: Innovator in Elastic Wave Processing

Introduction

Dae Ung Yoon is a prominent inventor based in Seoul, South Korea. He has made significant contributions to the field of elastic wave data processing. His innovative approach has led to the development of a unique method that enhances the accuracy and efficiency of elastic wave data analysis.

Latest Patents

Dae Ung Yoon holds a patent titled "Method for processing elastic wave data, elastic wave processing device using same, and program therefor." This patent outlines a method that includes selecting elastic wave traces, training interpolation and extrapolation models using machine learning, and restoring missing elastic wave traces. The method aims to generate additional elastic wave traces that were not included in the original data set.

Career Highlights

Dae Ung Yoon is affiliated with the Industry-University Cooperation Foundation at Hanyang University. His work focuses on advancing the methodologies used in processing elastic wave data, which is crucial for various applications in geophysics and engineering.

Collaborations

He collaborates with notable colleagues such as Joong Moo Byun and Ji Ho Park. Their combined expertise contributes to the innovative research and development in the field of elastic wave processing.

Conclusion

Dae Ung Yoon's contributions to elastic wave data processing exemplify the impact of innovative thinking in technology. His patent and collaborative efforts continue to push the boundaries of what is possible in this field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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