Seoul, South Korea

Dae Han Park

This inventor holds 1 USPTO granted patent. Top assignee: Industry-Academic Cooperation Foundation of Sunchon National University. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Dae Han Park. Retrieved from https://idiyas.com/inventor/dae-han-park-togi5hjq

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Dae Han Park and Smart-Farm Crop Phenotyping

Introduction

Dae Han Park is an inventor based in Seoul, South Korea. His work includes technology for analyzing crop growth and plant phenotypes using multiple types of images, with the aim of supporting more informed crop selection and cultivation in smart farms.

Latest Patents

Park is associated with 1 patent: “Apparatus for Analyzing Crop Growth Information Through Multiple Composite Images and Method for Exploring Plant Phenotypes Using the Same.” The disclosed technique uses RGB, thermal-imaging, and hyperspectral cameras to capture crop images. It analyzes the images, including composite images, to distinguish crop phenotypes and assess characteristics such as vegetation indices and water stress. This information can help growers compare crops’ environmental resistance and select genetic characteristics suited to the region, climate, and terrain of a smart farm.

Career Highlights

Park is associated with the Industry-Academic Cooperation Foundation of Sunchon National University. His patent work focuses on combining imaging technologies and crop analysis to support smart-farm decision-making and potentially improve farm profitability.

Collaborations

The provided information lists Meong Hun Lee and Hyun Yoe as Park’s coworkers. Their specific roles in the patent or related work were not provided.

Conclusion

Dae Han Park’s patent describes a multi-image approach to crop phenotyping that brings together RGB, thermal, and hyperspectral data to help growers evaluate crop traits and environmental responses.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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