Da-Chiang Chang is a prominent inventor based in Hsinchu, Taiwan. He has made significant contributions to the field of electromagnetic interference (EMI) detection through his innovative patents. With a total of five patents to his name, Chang continues to push the boundaries of technology in his area of expertise.

Latest Patents

One of his latest inventions is the "Active Measuring Probe for EMI Detection." This invention comprises a first connecting member, an impedance element, an amplifier, and a second connecting member. The design allows for effective EMI detection, enhancing the accuracy of measurements in various applications. Another notable patent is the "Conducted Type Current Probe," which includes a plurality of first resistors and at least one second resistor. This probe is designed to connect with a test Integrated Circuit (IC) and a test receiver, facilitating precise current measurements.

Career Highlights

Da-Chiang Chang is currently employed at the National Applied Research Laboratories, where he applies his expertise in developing advanced technologies. His work has been instrumental in improving EMI detection methods, which are crucial for ensuring the reliability of electronic devices.

Collaborations

Chang has collaborated with notable colleagues, including Yin-Cheng Chang and Hsien-Ku Chen. Their combined efforts have contributed to the advancement of research and development in their field.

Conclusion

Da-Chiang Chang's innovative work in EMI detection technologies showcases his commitment to advancing electronic measurement techniques. His contributions are vital for the ongoing development of reliable electronic systems.

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