Cécile Moulin

Title: Cécile Moulin: Innovator in Surface Defect Detection

Introduction

Cécile Moulin is a notable inventor based in Seyssinet-Pariset, France. He has made significant contributions to the field of electronics and optoelectronics through his innovative methods and devices. His work focuses on detecting surface defects on substrates, which is crucial for ensuring the quality and reliability of electronic components.

Latest Patents

Cécile Moulin holds a patent for a "Method for detecting surface defects on a substrate and device using said method." This invention involves a sophisticated approach to identifying surface defects, such as slip line type defects, on substrates intended for use in electronics and optoelectronics. The method includes projecting a pattern of light fringes and dark bands onto the substrate, displacing the substrate relative to the pattern, and acquiring a sequence of images that reflect the pattern. By analyzing the displacements of the fringes, the method determines the gradient of the substrate's surface and identifies any surface defects based on variations in this gradient.

Career Highlights

Throughout his career, Cécile Moulin has worked with prominent companies in the semiconductor industry. He has been associated with S.O.I.TEC Silicon on Insulator Technologies and Altatech Semiconductor, where he has contributed to advancements in semiconductor technology and defect detection methods.

Collaborations

Cécile has collaborated with talented professionals in his field, including Sophie Moritz and Philippe Gastaldo. These collaborations have likely enriched his work and contributed to the development of innovative solutions in surface defect detection.

Conclusion

Cécile Moulin's contributions to the field of surface defect detection have made a significant impact on the electronics and optoelectronics industries. His innovative methods and collaborations with industry professionals highlight his dedication to advancing technology.