New York, NY, United States of America

Curt Altmann

This inventor holds 1 USPTO granted patent. Top assignee: Yonwoo Co., Ltd.. Active years: 2018.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Curt Altmann. Retrieved from https://idiyas.com/inventor/curt-altmann

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 7(Granted Patents)


Company Filing History:


Years Active: 2018

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1 patent (USPTO):Explore Patents

Title: Curt Altmann: Innovator in Tubular Container Technology

Introduction

Curt Altmann is a notable inventor based in New York, NY (US). He has made significant contributions to the field of packaging technology, particularly with his innovative designs that enhance user experience.

Latest Patents

One of his key inventions is a patent for a tubular container having an applicator. This invention is characterized by an applicator made of metal and silicone, which contacts the skin. The design allows for the transfer of warmth or coldness to the skin, facilitating metabolism and improving skin elasticity.

Career Highlights

Curt Altmann has been associated with Yonwoo Co., Ltd., where he has applied his expertise in developing innovative packaging solutions. His work has garnered attention for its practical applications in the cosmetic and skincare industries.

Collaborations

He has collaborated with talented individuals such as Sung-Hwan Kim and Eugene Dennison Kim, contributing to the advancement of their projects and innovations.

Conclusion

Curt Altmann's contributions to the field of packaging technology, particularly through his patented tubular container, demonstrate his commitment to innovation and improving user experience. His work continues to influence the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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