Katy, TX, United States of America

Cristian Rivas


Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2012

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1 patent (USPTO):Explore Patents

Title: Cristian Rivas: Innovator in VUV Metrology Systems

Introduction

Cristian Rivas is a notable inventor based in Katy, TX (US). He has made significant contributions to the field of metrology, particularly with his innovative approach to calibration methodologies. His work is characterized by a focus on enhancing the accuracy and reliability of measurement systems.

Latest Patents

Cristian Rivas holds a patent for an "Automated calibration methodology for VUV metrology system." This patent describes a calibration pad equipped with multiple calibration sites. Each site can be utilized until it is deemed unacceptable for further use, such as due to contamination. The methodology allows for the movement between different calibration sites over time, ensuring optimal performance. Various criteria, including measured reflectance data and exposure to light, are established to determine when a site should be designated as 'bad.' This innovative approach enhances the efficiency of calibration processes, whether using a single calibration sample or multiple samples.

Career Highlights

Cristian Rivas is currently employed at Jordan Valley Semiconductors Ltd., where he continues to develop cutting-edge technologies in the semiconductor industry. His work has been instrumental in advancing the capabilities of VUV metrology systems, contributing to improved measurement accuracy.

Collaborations

Cristian has collaborated with notable colleagues, including Jeffrey B. Hurst and Matthew Weldon. These partnerships have fostered a collaborative environment that encourages innovation and the sharing of ideas.

Conclusion

Cristian Rivas is a distinguished inventor whose work in automated calibration methodologies has made a significant impact in the field of metrology. His innovative solutions continue to enhance the accuracy and reliability of measurement systems.

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