Raleigh, NC, United States of America

Craig W Beeghly

This inventor holds 5 USPTO granted patents. Top assignee: Kennametal Inc.. Active years: 1992-1997.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Craig W Beeghly. Retrieved from https://idiyas.com/inventor/craig-w-beeghly

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 5

Forward Citations = 91(Granted Patents)


Company Filing History:


Years Active: 1992-1997

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5 patents (USPTO):Explore Patents

Title: Innovations of Craig W. Beeghly

Introduction

Craig W. Beeghly is an accomplished inventor based in Raleigh, NC (US). He has made significant contributions to the field of cutting tools, holding a total of 5 patents. His work primarily focuses on enhancing the efficiency and effectiveness of ceramic cutting tools.

Latest Patents

Among his latest innovations are two notable patents: the "Ceramic cutting tool with chip control" and the "Method of using a ceramic cutting tool with chip control." These patents describe a ceramic cutting insert designed for high-speed machining of materials, featuring an integral chip control surface that improves performance and precision.

Career Highlights

Craig is currently employed at Kennametal Inc., a leading company in the manufacturing of tooling and industrial materials. His expertise in ceramic cutting tools has positioned him as a key player in the development of advanced machining solutions.

Collaborations

Throughout his career, Craig has collaborated with talented professionals, including Deepak P. Ahuja and Pankaj K. Mehrotra. These partnerships have fostered innovation and contributed to the success of their projects.

Conclusion

Craig W. Beeghly's contributions to the field of cutting tools exemplify his dedication to innovation and excellence. His patents and collaborations continue to influence the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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