Dunfermline, United Kingdom

Craig Robertson

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Optos Plc. Active years: 2015.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Craig Robertson. Retrieved from https://idiyas.com/inventor/craig-robertson-i6k2k9rl

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 8(Granted Patents)


Company Filing History:


Years Active: 2015

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1 patent (USPTO):Explore Patents

Title: The Innovative Mind of Craig Robertson

Introduction

Craig Robertson is a notable inventor based in Dunfermline, GB. He has made significant contributions to the field of imaging technology. His work focuses on identifying anomalies in images produced by imaging devices.

Latest Patents

Craig holds a patent for a method of identifying anomalies in images. This method involves receiving first and second pluralities of candidate anomalies identified in subsequent images. A constellation match is performed between these candidate anomalies to identify correlations, represented by a constellation match value. The process includes determining multiple constellation match values with varying relative x-y shifts. If a strong correlation is found at a specific x-y shift, it indicates that the candidate anomalies are common between the images, suggesting the presence of anomalies.

Career Highlights

Craig is currently employed at Optos Plc, a company known for its innovative imaging solutions. His work at Optos Plc has allowed him to apply his inventive skills in a practical setting.

Collaborations

Craig collaborates with David Clifton, enhancing the innovative efforts at Optos Plc.

Conclusion

Craig Robertson's contributions to imaging technology through his patent demonstrate his innovative spirit and dedication to advancing the field. His work continues to impact the way anomalies in images are identified and analyzed.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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