Houston, TX, United States of America

Craig Raisanen

This inventor holds 1 USPTO granted patent. Top assignee: Schlumberger Technology Corporation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Craig Raisanen. Retrieved from https://idiyas.com/inventor/craig-raisanen

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Craig Raisanen and His Drill-Bit Innovation.

Introduction

Craig Raisanen is an inventor based in Houston, Texas, and is associated with Schlumberger Technology Corporation. His patent work addresses drill-bit design and the arrangement of cutting elements.

Latest Patents

The provided information identifies one patent for Raisanen: “Variable Cutting Element Exposure in a Cutting Tool.” The invention describes a drill bit with a roller cone carrying cutting inserts and a blade carrying fixed cutting elements. The roller cone’s cutting profile extends above the fixed cutting profile, with that exposure increasing farther from the bit axis in the radial direction. This arrangement concerns how the two types of cutting elements engage material during drilling. Raisanen is credited with 1 patent.

Career Highlights

Raisanen’s listed patent reflects work on cutting-tool technology for drilling applications. The patent record associates him with Schlumberger Technology Corporation and identifies Houston, Texas, as his location.

Collaborations

The provided information names Mason Cherry and Philip Trunk as Raisanen’s coworkers. It does not specify their roles in the patent or describe particular collaborative contributions.

Conclusion

Craig Raisanen’s identified patent focuses on varying the exposure of roller-cone cutting elements relative to fixed cutting elements, contributing to innovation in drill-bit design.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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