Craig M Monroe

Title: Craig M Monroe: Innovator in Integrated Circuit Testing

Introduction

Craig M Monroe is a notable inventor based in South Burlington, Vermont. He has made significant contributions to the field of integrated circuit testing, holding a total of 5 patents. His work focuses on enhancing the efficiency and accuracy of memory testing in integrated circuits.

Latest Patents

Among his latest patents is an "Apparatus for capturing results of memory testing." This invention outlines a method to produce a description file of Joint Test Action Group (JTAG) capture-shift test data registers. It is designed to interpret test results of memory included in an integrated circuit structure configured for testing integrated circuit memory. The invention involves a computer that extracts names from a data file, which controls the hierarchical and architectural arrangement of components within an integrated circuit. The extracted names are then added to a description file to facilitate the interpretation of memory test results.

Another significant patent is the "Built-in-self-test (BIST) organizational file generation." This invention provides a method for creating a BIST organizational file for an integrated circuit chip. The process includes receiving a design file with a hierarchy of memory modules, scanning memory wrappers for BIST types, and creating an ordered list of memory wrappers. The method enhances the organization and efficiency of built-in self-tests for integrated circuits.

Career Highlights

Craig has worked with prominent companies in the technology sector, including IBM and Globalfoundries Inc. His experience in these organizations has allowed him to develop and refine his innovative ideas in integrated circuit testing.

Collaborations

Throughout his career, Craig has collaborated with talented individuals such as Michael Richard Ouellette and Douglas E Sprague. These collaborations have contributed to the advancement of his inventions and the overall field of integrated circuit technology.

Conclusion

Craig M Monroe's contributions to integrated circuit testing through his patents and collaborations highlight his role as an innovator in the field. His work continues to influence the development of more efficient testing methods for integrated circuits.