Kaysville, UT, United States of America

Craig Keith Jarman

This inventor holds 2 USPTO granted patents. Top assignees: Buck Partners, Spinach Marketing, LLC. Active years: 2019-2021.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Craig Keith Jarman. Retrieved from https://idiyas.com/inventor/craig-keith-jarman

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2019-2021

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2 patents (USPTO):Explore Patents

Title: Craig Keith Jarman: Innovator in Display Monitoring Systems

Introduction

Craig Keith Jarman is a notable inventor based in Kaysville, UT (US). He has made significant contributions to the field of display monitoring systems, holding a total of 2 patents. His work focuses on enhancing the interaction between display sensors and stakeholders.

Latest Patents

Jarman's latest patent is a display monitoring system that exchanges information with display sensors. This system is designed to respond to multiple display stakeholders based on conclusions drawn from the information gathered. His innovative approach aims to improve the efficiency and effectiveness of display monitoring.

Career Highlights

Throughout his career, Craig Keith Jarman has worked with various companies, including Buck Partners and Spinach Marketing, LLC. His experience in these organizations has contributed to his expertise in developing advanced display technologies.

Collaborations

Some of Jarman's notable coworkers include Brian Gene Buck and Matthew Murray Botke. Their collaboration has likely played a role in the development of his innovative solutions.

Conclusion

Craig Keith Jarman is a distinguished inventor whose work in display monitoring systems has made a significant impact in the field. His patents and career achievements reflect his dedication to innovation and technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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