Peoria, AZ, United States of America

Craig Deon Axtell

This inventor holds 1 USPTO granted patent. Top assignee: Honeywell International Inc.. Active years: 2016.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Craig Deon Axtell. Retrieved from https://idiyas.com/inventor/craig-deon-axtell

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2016

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1 patent (USPTO):Explore Patents

Title: Craig Deon Axtell and Air Traffic Control Data Management.

Introduction

Craig Deon Axtell is an inventor associated with Peoria, Arizona, and Honeywell International Inc. His patent work addresses the management of air traffic control center data used during system logon.

Latest Patents

Axtell is named on 1 patent: “Method for Management of Air Traffic Control Center Database Used for Air Traffic Control Center Logon.” The invention describes an avionics system that compares separately loaded air traffic control center data with hard-coded data. It prompts an operator to validate any differences through a human-machine interface and updates the master database after validation. The system is designed to support controlled, operator-verified updates to air traffic control center information.

Career Highlights

Axtell’s listed patent is associated with Honeywell International Inc. It focuses on avionics data management and the validation of air traffic control center information.

Collaborations

Thomas D. Judd and Scott Madaras are identified as Axtell’s coworkers. The available information does not specify their roles in the patent or any particular collaboration with him.

Conclusion

Craig Deon Axtell’s patent work reflects an emphasis on reliable air traffic control data management, with operator validation serving as a key safeguard when updating master system information.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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