North Ridgeville, OH, United States of America

Craig Arthur Butler

This inventor holds 1 USPTO granted patent. Top assignee: R.w. Beckett Corporation. Active years: 2020.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Craig Arthur Butler. Retrieved from https://idiyas.com/inventor/craig-arthur-butler

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2020

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1 patent (USPTO):Explore Patents

Title: Craig Arthur Butler: Innovator in Tank Gauge Technology

Introduction

Craig Arthur Butler is an accomplished inventor based in North Ridgeville, Ohio. He has made significant contributions to the field of tank gauge technology. With a focus on innovation, Butler has developed solutions that enhance the efficiency and accuracy of tank monitoring systems.

Latest Patents

Butler holds a patent for a tank gauge, which showcases his expertise in creating practical and effective solutions for monitoring liquid levels in various applications. This invention reflects his commitment to advancing technology in this area.

Career Highlights

Currently, Craig Arthur Butler is employed at R.W. Beckett Corporation, where he continues to apply his skills and knowledge in the field of engineering and innovation. His work at the company has allowed him to further develop his ideas and contribute to the industry.

Collaborations

Throughout his career, Butler has collaborated with talented individuals such as Christopher Allen Fildes and Jeffrey Robert Traczek. These partnerships have fostered a creative environment that encourages the exchange of ideas and innovation.

Conclusion

Craig Arthur Butler is a notable inventor whose work in tank gauge technology has made a significant impact. His dedication to innovation and collaboration continues to drive advancements in the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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