Ceres, CA, United States of America

Craig A Scheer

This inventor holds 1 USPTO granted patent. Top assignee: Vlsi Standards, Inc.. Active years: 1997.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Craig A Scheer. Retrieved from https://idiyas.com/inventor/craig-a-scheer-j1q0gvnv

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 14(Granted Patents)


Company Filing History:


Years Active: 1997

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1 patent (USPTO):Explore Patents

Title: The Innovative Contributions of Craig A. Scheer

Introduction

Craig A. Scheer is an accomplished inventor based in Ceres, California. He has made significant contributions to the field of technology, particularly in the development of methods and apparatuses that enhance scientific measurement techniques. His work is characterized by a commitment to innovation and precision.

Latest Patents

Craig A. Scheer holds a patent for a "Method and apparatus for operating a condensation nucleus counter." This invention includes a saturator and a condenser equipped with a thermoelectric device (TED) that simultaneously cools the condenser and heats the saturator. The design features a controller that maintains the temperature differential between the saturator and the condenser to within ±1.5 degrees Celsius at steady state. Users can set the controller to operate at any desired setpoint temperature, showcasing the flexibility and user-friendliness of the device.

Career Highlights

Craig is currently employed at VLSI Standards, Inc., where he continues to push the boundaries of technology and innovation. His work at the company reflects his dedication to advancing scientific tools and methodologies.

Collaborations

Craig A. Scheer collaborates with his coworker, Bradley W. Scheer, contributing to a dynamic work environment that fosters innovation and creativity.

Conclusion

Craig A. Scheer's contributions to the field of technology through his innovative patent demonstrate his expertise and commitment to advancing scientific measurement techniques. His work continues to impact the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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