Buchare, Romania

Costel Patrascu

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Tttech Computertechnik Ag. Active years: 2021.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Costel Patrascu. Retrieved from https://idiyas.com/inventor/costel-patrascu

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2021

Loading Chart...
Loading Chart...
1 patent (USPTO):Explore Patents

Title: Innovations of Costel Patrascu

Introduction

Costel Patrascu is a notable inventor based in Bucharest, Romania. He has made significant contributions to the field of technology, particularly in memory systems. His innovative approach to error detection in ternary content addressable memory (TCAM) has garnered attention in the industry.

Latest Patents

Costel Patrascu holds a patent for a "Method of error detection in a ternary content addressable memory." This method provides a real-time solution for error detection initiated with a read operation at a specified input address. The invention includes an additional random access memory (RAM) that matches the number of locations in the TCAM. Both the TCAM and RAM contain corresponding read data entries, which consist of data and a mask placed at the same address locations. This innovative method enhances the reliability of memory systems.

Career Highlights

Costel Patrascu is currently associated with TTTech Computertechnik AG, a company known for its advanced technology solutions. His work at TTTech focuses on improving memory systems and ensuring data integrity through innovative methods.

Conclusion

Costel Patrascu's contributions to the field of technology, particularly through his patent on error detection in TCAM, highlight his role as an influential inventor. His work continues to impact the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…