Corey Jason Goodrich

Title: Corey Jason Goodrich: Innovator in Fault Testing Technology

Introduction

Corey Jason Goodrich is a notable inventor based in McKinney, TX (US). He has made significant contributions to the field of fault testing technology, particularly in the area of built-in self-testing (BIST). His innovative approach has led to advancements that enhance the reliability and efficiency of electronic testing processes.

Latest Patents

Corey holds a patent for "Path-based crosstalk fault test scanning in built-in self-testing." This patent utilizes a path-based crosstalk fault model in conjunction with BIST and software for automatic test pattern generation. The solution enables the generation of test patterns that maximize switching activity, as well as inductive and capacitive crosstalk. Unlike conventional fault models that focus on discrete nets, this path-based model targets the cumulative effects of crosstalk along a specific net, referred to as the 'victim' path. The BIST solution provides full controllability of the target paths and any associated aggressors, facilitating defect detection and silicon validation of delay defects on long parallel nets.

Career Highlights

Corey is currently employed at Texas Instruments Corporation, where he continues to develop innovative solutions in the field of electronic testing. His work has been instrumental in advancing the capabilities of BIST technologies, making significant impacts on the industry.

Collaborations

Corey has collaborated with talented individuals such as Xiao Liu and Nisar Ahmed, contributing to a dynamic work environment that fosters innovation and creativity.

Conclusion

Corey Jason Goodrich's contributions to fault testing technology exemplify the spirit of innovation in the electronics industry. His patent and ongoing work at Texas Instruments Corporation highlight his commitment to enhancing testing methodologies and ensuring the reliability of electronic devices.