Oberkochen, Germany

Constantin Klug

This inventor holds 1 USPTO granted patent. Top assignee: Carl Zeiss Ag. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Constantin Klug. Retrieved from https://idiyas.com/inventor/constantin-klug-3baz4aa0

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Constantin Klug: Innovator in Electro-Optical Observation Systems

Introduction

Constantin Klug is a notable inventor based in Oberkochen, Germany. He has made significant contributions to the field of electro-optical observation systems, particularly in applications related to hunting. His innovative approach combines advanced technology with practical utility, enhancing the capabilities of observation systems.

Latest Patents

Klug holds a patent for an "Electro-optical observation system for hunting." This system features an electronic image detector paired with an optical unit. It includes a processor that can exchange data with the image detector, analyze image streams for objects that differ from the background, and control a user interface to notify users when such objects are detected.

Career Highlights

Constantin Klug is associated with Carl Zeiss AG, a leading company in optics and optoelectronics. His work at this esteemed organization has allowed him to develop cutting-edge technologies that push the boundaries of traditional observation systems.

Collaborations

One of Klug's notable collaborators is Hexin Wang. Their partnership exemplifies the collaborative spirit in the field of innovation, where diverse expertise can lead to groundbreaking advancements.

Conclusion

Constantin Klug's contributions to electro-optical observation systems reflect his commitment to innovation and technology. His patent demonstrates the potential for enhancing hunting experiences through advanced imaging techniques.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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