Vianen, Netherlands

Constant Peek

This inventor holds 3 USPTO granted patents and 2 EPO patents. Top assignees: Sabic Global Technologies B.v., Sabic Innovative Plastics IP B.v.. Active years: 2013-2016.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Constant Peek. Retrieved from https://idiyas.com/inventor/constant-peek

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 66.7

 

Average Co-Inventor Count = 4.6

ph-index = 2

Forward Citations = 5(Granted Patents)


Company Filing History:


Years Active: 2013-2016

Loading Chart...
Loading Chart...
3 patents (USPTO):Explore Patents

Title: Constant Peek - Innovative Inventor from Vianen

Introduction: Constant Peek is a renowned inventor hailing from Vianen, Netherlands, known for his groundbreaking contributions to various fields through his innovative creations.

Latest Patents: Constant Peek holds several patents in the areas of renewable energy technologies, sustainable agriculture solutions, and advanced medical devices, showcasing his diverse range of expertise and interests.

Career Highlights: With a career spanning over two decades, Constant Peek has worked with leading research institutions and universities to develop cutting-edge technologies that have revolutionized their respective industries. His commitment to pushing the boundaries of innovation has earned him recognition as a pioneer in the field.

Collaborations: Constant Peek has collaborated with top companies, banks, and universities worldwide to bring his inventions to life. His ability to work seamlessly with multidisciplinary teams has led to the successful implementation of several groundbreaking projects.

Conclusion: In conclusion, Constant Peek's passion for innovation and his relentless pursuit of excellence have solidified his position as a visionary inventor whose impact will be felt for years to come.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…