Conrad J Dell'Oca

Conrad J Dell'Oca is a prominent inventor based in Palo Alto, CA, known for his significant contributions to semiconductor technology. With a total of 6 patents, he has developed innovative methods that enhance the efficiency and reliability of semiconductor devices.

Latest Patents

One of his latest patents is titled "Method of die burn-in." This invention provides a burn-in test conducted at the wafer level, prior to the separation of dies into individual chips. The method involves connecting a series of chips to an external current source, heating the semiconductor wafer, and applying a common signal to ensure effective burn-in of the die. Another notable patent is "Method and apparatus for isolation of flux materials in 'flip-chip'." This invention introduces a preformed planar structure that maintains a minimum gap between chips and substrates in flip-chip structures. It allows for selective application of liquid flux to solder balls, ensuring mechanical integrity during soldering.

Career Highlights

Conrad J Dell'Oca has made a significant impact in the field of semiconductor technology through his work at LSI Logic Corporation. His innovative approaches have paved the way for advancements in the manufacturing and performance of semiconductor devices.

Collaborations

Throughout his career, he has collaborated with notable professionals, including Nicholas F Pasch and Vahak K Sahakian, contributing to the development of cutting-edge technologies in the semiconductor industry.

Conclusion

Conrad J Dell'Oca's contributions to semiconductor technology through his patents and collaborations highlight his role as a key innovator in the field. His work continues to influence advancements in semiconductor manufacturing and design.