Beijing, China

Congqi Zheng

This inventor holds 1 USPTO granted patent. Top assignees: Boe Technology Group Co., Ltd., Hefei Xinsheng Optoelectronics Technology Co., Ltd.. Active years: 2017.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Congqi Zheng. Retrieved from https://idiyas.com/inventor/congqi-zheng

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Average Co-Inventor Count = 5.0

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Company Filing History:


Years Active: 2017

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1 patent (USPTO):Explore Patents

Title: Congqi Zheng - Innovator in Target Material Thickness Measurement

Introduction

Congqi Zheng is a notable inventor based in Beijing, China. He has made significant contributions to the field of measurement technology, particularly with his innovative approach to measuring the thickness of target materials. His work has implications for various industries that require precise measurements.

Latest Patents

Congqi Zheng holds a patent for a "Target Material Thickness Measuring Apparatus." This invention includes a support structure and multiple distance measuring units arranged in a first direction. The apparatus is designed to measure the thickness of different portions of a target material at various positions simultaneously. This capability enhances measurement efficiency by allowing multiple thickness values to be obtained in a single measurement process.

Career Highlights

Throughout his career, Congqi Zheng has worked with prominent companies in the technology sector. He has been associated with Hefei Xinsheng Optoelectronics Technology Co., Ltd. and BOE Technology Group Co., Ltd. His experience in these organizations has contributed to his expertise in measurement technologies.

Collaborations

Congqi Zheng has collaborated with several professionals in his field, including Deyong Wang and Daeyoung Choi. These collaborations have likely enriched his work and led to advancements in measurement technology.

Conclusion

Congqi Zheng is a distinguished inventor whose work in target material thickness measurement showcases his innovative spirit and technical expertise. His contributions are valuable to the advancement of measurement technologies.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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