Yardley, CA, United States of America

Colin Earle

This inventor holds 1 USPTO granted patent. Top assignee: Sri International. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Colin Earle. Retrieved from https://idiyas.com/inventor/colin-earle

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Colin Earle - Innovator in Image Sensor Technology

Introduction

Colin Earle is an inventive mind based in Yardley, CA (US). He has made significant strides in the field of image sensor technology. His innovative approach focuses on enhancing the performance of pixel arrays in image sensors.

Latest Patent Applications

Colin Earle's notable patent application is titled "ON-THE-FLY DEFECTIVE PIXEL CORRECTION." This application discusses an image sensor with a pixel array that contains two or more pixels. The application details a defective pixel detector that identifies defective pixels. A dynamic threshold range is established based on the amplitude levels of neighboring pixels. The detector utilizes this dynamic threshold range to assess the status of the pixel under analysis, comparing its amplitude level to that of its neighboring pixels. Furthermore, the detector employs algorithms to generate candidate pixel patterns for the neighboring pixels, which are instrumental in creating the dynamic threshold range. The value of this dynamic threshold range is adaptable, changing according to the amplitude levels of the neighboring pixels.

Conclusion

Colin Earle's contributions to image sensor technology, particularly through his innovative patent application, showcase his commitment to advancing the field. His work in defective pixel correction is a testament to his inventive spirit and dedication to improving image quality.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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