Santa Fe, NM, United States of America

Clyde Bennet Wheeler

This inventor holds 2 USPTO granted patents. Top assignee: Descartes Labs, Inc.. Active years: 2022-2023.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Clyde Bennet Wheeler. Retrieved from https://idiyas.com/inventor/clyde-bennet-wheeler

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 5(Granted Patents)


Company Filing History:


Years Active: 2022-2023

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2 patents (USPTO):Explore Patents

Title: Clyde Bennet Wheeler: Innovator in Thermal Anomaly Detection

Introduction

Clyde Bennet Wheeler is a notable inventor based in Santa Fe, NM (US). He has made significant contributions to the field of thermal anomaly detection, holding two patents that showcase his innovative approach to technology.

Latest Patents

Wheeler's latest patents focus on thermal anomaly detection and classification. In these patents, a set of images is received, and a thermal anomaly is detected within that set. The detected thermal anomaly is then classified into various categories, including stationary targets, gas flares, agricultural anomalies, and wildfires. An action is taken based at least in part on the classified detected anomaly, demonstrating the practical applications of his work.

Career Highlights

Clyde Bennet Wheeler is currently employed at Descartes Labs, Inc., where he continues to develop and refine his innovative technologies. His work has implications for various industries, including agriculture and environmental monitoring.

Collaborations

Wheeler collaborates with talented individuals in his field, including his coworker Hang Zhou. Their combined expertise contributes to the advancement of thermal anomaly detection technologies.

Conclusion

Clyde Bennet Wheeler's contributions to thermal anomaly detection highlight his role as an innovator in the field. His patents reflect a commitment to advancing technology for practical applications.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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