This inventor holds 1 USPTO granted patent. Top assignee: University of Hawai'i. Active years: 2006.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2006
Title: Clive Oppenheimer: Innovator in Radiation Measurement Technology
Introduction
Clive Oppenheimer is a notable inventor based in Cambridge, GB. He has made significant contributions to the field of radiation measurement technology. His innovative approach has led to the development of a unique device that enhances the ability to measure radiation effectively.
Latest Patents
Oppenheimer holds a patent for an "Apparatus for measuring radiation and method of use." This device is designed to measure radiation and comprises optics and electronics that are at least partially enclosed in a portable housing. The housing features a window that allows radiation of a desired wavelength to enter, while the internal optics and electronics collect and convert the admitted radiation into an electrical signal. A data processor, which may be located within or outside the housing, can convert and store this electrical signal in an analyzed, digital form. This patent highlights Oppenheimer's commitment to advancing technology in radiation measurement.
Career Highlights
Clive Oppenheimer is affiliated with the University of Hawai'i, where he continues to contribute to research and innovation in his field. His work has garnered attention for its practical applications and potential impact on various industries.
Collaborations
Oppenheimer has collaborated with notable colleagues, including Harold Garbeil and John Porter. These partnerships have fostered a collaborative environment that encourages innovation and the sharing of ideas.
Conclusion
Clive Oppenheimer's contributions to radiation measurement technology exemplify his dedication to innovation. His patent and ongoing work at the University of Hawai'i reflect his commitment to advancing scientific understanding and practical applications in this important field.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
