Kanata, Canada

Claus Christensen

This inventor holds 1 USPTO granted patent. Top assignee: Marvell Asia Pte., Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Claus Christensen. Retrieved from https://idiyas.com/inventor/claus-christensen-2a7t6kmr

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Claus Christensen and His Patent in Multi-Chip Error Monitoring.

Introduction

Claus Christensen is an inventor associated with Kanata, Canada, and Marvell Asia Pte., Ltd. His work includes a patent for monitoring forward error correction information across multiple integrated circuit chips.

Latest Patents

Christensen is credited with 1 patent: “Monitoring FEC Information in Multi-Chip Environment.” The invention describes a communication device in which separate integrated circuit chips process different portions of an input data signal. Each chip’s forward error correction decoder generates information about errors in its portion, and the first chip combines its own error information with information received from the second chip to produce error statistics.

Career Highlights

The patent addresses how a multi-chip communication device can gather error information across its components. By combining decoder information from separate chips, the system can generate statistics that reflect errors across multiple portions of the input signal.

Collaborations

Christensen’s listed coworkers include Federico Magni and Paolo Pascale. The patent describes communication between two integrated circuit chips, with one chip sending error information to the other for use in generating statistics.

Conclusion

Claus Christensen’s patent focuses on coordinating forward error correction information across multiple chips, supporting broader error monitoring in communication devices.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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