Seeheim-Jugenheim, Germany

Claudius Volz

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Smiths Heimann Gmbh. Active years: 2014.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Claudius Volz. Retrieved from https://idiyas.com/inventor/claudius-volz-a18tq5ld

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

 

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2014

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1 patent (USPTO):Explore Patents

Title: Claudius Volz: Innovator in Electromagnetic Detection Technologies

Introduction

Claudius Volz is a notable inventor based in Seeheim-Jugenheim, Germany. He has made significant contributions to the field of electromagnetic detection technologies. His innovative approach has led to the development of a unique method for detecting hidden objects.

Latest Patents

Claudius Volz holds a patent for a "Method and device for detecting hidden objects by means of electromagnetic millimeter waves." This method involves irradiating a test object with millimeter waves and evaluating the waves that are reflected from the object. The technology focuses on different depth layers of the test object during the irradiation process, enhancing the detection capabilities.

Career Highlights

Volz is currently employed at Smiths Heimann GmbH, where he continues to work on advancing detection technologies. His expertise in electromagnetic waves has positioned him as a key figure in his field.

Collaborations

He collaborates with Michael Jeck, contributing to innovative projects and research within the company.

Conclusion

Claudius Volz's work in electromagnetic detection showcases his commitment to innovation and technology. His patent reflects a significant advancement in the ability to detect hidden objects, marking him as a valuable inventor in this specialized field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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