Putzbrunn, Germany

Claudia Latzel

This inventor holds 1 USPTO granted patent. Top assignee: Freescale Semiconductor,inc.. Active years: 2016.


Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2016

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1 patent (USPTO):Explore Patents

Title: Claudia Latzel: Innovator in Semiconductor Technology

Introduction

Claudia Latzel is a prominent inventor based in Putzbrunn, Germany. She has made significant contributions to the field of semiconductor technology, particularly in the area of logic built-in self-test circuits. Her innovative work has led to the development of a patented circuit arrangement that enhances the testing capabilities of semiconductor devices.

Latest Patents

Claudia holds a patent for a "Circuit arrangement for logic built-in self-test of a semiconductor device and a method of operating such circuit arrangement." This invention includes a clock source that generates a system clock, first and second clock division circuitry, and multiple scan chains that operate at a derived clock. The design aims to improve the efficiency and reliability of testing semiconductor devices, showcasing her expertise in this technical domain. She has 1 patent to her name.

Career Highlights

Claudia Latzel is currently employed at Freescale Semiconductor, Inc., where she continues to push the boundaries of semiconductor technology. Her work has been instrumental in advancing the capabilities of logic built-in self-test systems, which are crucial for ensuring the quality and performance of semiconductor devices.

Collaborations

Throughout her career, Claudia has collaborated with notable colleagues, including Bernhard Richter and Heiko Ahrens. These partnerships have fostered a collaborative environment that encourages innovation and the sharing of ideas within the semiconductor industry.

Conclusion

Claudia Latzel's contributions to semiconductor technology through her innovative patents and collaborative efforts highlight her role as a key figure in the field. Her work continues to influence the development of reliable testing methods for semiconductor devices, ensuring their performance and quality in various applications.

Profile summary based on public USPTO records.
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