Clark N Kadlec

Title: Clark N Kadlec: Innovator in Semiconductor Measurement Technology

Introduction

Clark N Kadlec is a notable inventor based in Albuquerque, NM (US). He has made significant contributions to the field of semiconductor technology, particularly in the measurement of optical absorption. His innovative approach has led to advancements that enhance the understanding of semiconductor materials.

Latest Patents

Clark N Kadlec holds a patent for an "Apparatus and method to measure semiconductor optical absorption using microwave charge sensing." This invention features a time-resolved microwave reflectance apparatus that utilizes a pulsed or modulated optical source to irradiate a semiconductor sample. The apparatus includes a microwave oscillator that continuously irradiates the sample with microwaves, and a microwave detector that captures the microwaves reflected by the sample. This method allows for charge detection, which is a novel approach compared to conventional absorption measurements that typically detect the loss of photons. This innovation enables the extraction of the absorption coefficient and band edge of semiconductor materials.

Career Highlights

Clark N Kadlec is associated with National Technology & Engineering Solutions of Sandia, LLC, where he applies his expertise in semiconductor technology. His work has been instrumental in advancing the methodologies used in semiconductor research and measurement.

Collaborations

Throughout his career, Clark has collaborated with notable colleagues, including Michael Goldflam and Eric A Shaner. These collaborations have contributed to the development of innovative technologies in the field.

Conclusion

Clark N Kadlec's contributions to semiconductor measurement technology exemplify the impact of innovative thinking in scientific research. His patent and work at National Technology & Engineering Solutions of Sandia, LLC highlight his role as a key figure in advancing semiconductor technology.