Paris, France

Claire Bonfils-Bierer

This inventor holds 1 USPTO granted patent. Top assignee: Kayrros. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Claire Bonfils-Bierer. Retrieved from https://idiyas.com/inventor/claire-bonfils-bierer

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Claire Bonfils-Bierer and Innovation in Industrial Emissions Monitoring.

Introduction

Claire Bonfils-Bierer is an inventor associated with Kayrros in Paris, France. Her patent work addresses the detection, measurement, and attribution of synthetic gas emissions from industrial assets.

Latest Patents

Bonfils-Bierer is named on 1 patent: “Method and System for Detecting, Quantifying, and Attributing Gas Emissions of Industrial Assets.” The invention describes a method that uses overhead imagery to obtain gas-concentration images, detect gas plumes, quantify their emission rates, estimate their point sources, and attribute them to actual sources. Its corresponding system uses stored image data and a processor configured to perform these monitoring and attribution tasks.

Career Highlights

Her listed company affiliation is Kayrros, which develops technology for monitoring industrial and environmental activity. The patent reflects an approach that combines image acquisition and computational analysis to help identify and assess emissions from industrial assets.

Collaborations

The provided information lists Clément Giron and Matthieu Mazzolini as Bonfils-Bierer’s coworkers. Their names are associated with her professional context, though specific roles in the patent or other projects were not provided.

Conclusion

Claire Bonfils-Bierer’s patent work at Kayrros focuses on using imagery and data processing to detect, quantify, and trace industrial gas emissions to their sources.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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