Jersey City, NJ, United States of America

Cital Patel

This inventor holds 1 USPTO granted patent. Top assignee: Citibank, N.a.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Cital Patel. Retrieved from https://idiyas.com/inventor/cital-patel

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Cital Patel and Software Development Quality Analysis

Introduction

Cital Patel is an inventor based in Jersey City, New Jersey. His patent work addresses software quality analysis, error detection, and automated remediation during application development.

Latest Patents

Patel is associated with 1 patent, titled “Quality Analysis and Scoring for Software Development Projects.” The patent describes systems, methods, and devices that use functional specifications and user requirements to guide a generative machine learning model. The model produces application-specific parameters for evaluating software elements against those requirements. When the resulting quality metrics identify elements that do not conform, the system generates and automatically implements modifications to remediate the errors.

Career Highlights

Patel’s disclosed invention focuses on applying generative machine learning to software development quality control. By connecting project specifications with dynamic evaluation rules, the approach aims to identify and address errors as an application is being generated. Patel is associated with Citibank, N.A.

Collaborations

The provided information lists Pranita Santosh Patil and Richard Eric Lawton as Patel’s coworkers. It does not specify their roles in the patent or whether they collaborated on the invention.

Conclusion

Cital Patel’s patent centers on using machine learning to assess software against project requirements and automate corrective changes, highlighting an approach to improving quality during application development.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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