This inventor holds 1 USPTO granted patent. Top assignee: Scientific System Research Limited. Active years: 2004.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2004
Title: Ciaran O'Morain: Innovator in Plasma Process Fault Detection
Introduction
Ciaran O'Morain is a notable inventor based in Palmerstown, Ireland. He has made significant contributions to the field of plasma processing, particularly in fault detection methods. His innovative approach has the potential to enhance the efficiency and reliability of plasma processes in various applications.
Latest Patents
Ciaran O'Morain holds a patent for a "Method for fault detection in a plasma process." This method involves detecting faults in a plasma process chamber powered by an RF source and subject to periodic standard preventive maintenance. Before a production run, changes in the magnitude of several Fourier components of the RF source are determined based on known changes in various process conditions. A single parameter, which is a linear combination of a selected subset of these components, is constructed to be sensitive to pre-selected process changes while remaining relatively insensitive to standard preventive maintenance. During the production run, this parameter is monitored to identify any faults in the plasma process.
Career Highlights
Ciaran O'Morain has established himself as a key figure in the field of plasma technology. His work at Scientific System Research Limited has allowed him to focus on innovative solutions that address critical challenges in plasma processing. His patent reflects his commitment to advancing technology in this area.
Collaborations
Ciaran has collaborated with notable colleagues such as Kevin O'Leary and John Scanlan. Their combined expertise contributes to the development of cutting-edge technologies in the field.
Conclusion
Ciaran O'Morain's contributions to plasma process fault detection exemplify the impact of innovation in technology. His patent showcases a method that could significantly improve the reliability of plasma processes.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile