Beijing, China

Chunxi Wang

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Beijing Aerospace Institute for Metrology and Measurement Technology. Active years: 2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Chunxi Wang. Retrieved from https://idiyas.com/inventor/chunxi-wang-xd54fry5

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 11.0

ph-index = 1


Company Filing History:


Years Active: 2024

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1 patent (USPTO):Explore Patents

Title: The Innovative Contributions of Chunxi Wang

Introduction

Chunxi Wang is a notable inventor based in Beijing, China. He has made significant contributions to the field of metrology and measurement technology. His work is particularly recognized for its innovative approach to orientation methods.

Latest Patents

Chunxi Wang holds a patent for a "Single star-based orientation method using dual-axis level sensor." This patent discloses a method that includes both a calibration process and an actual calculation process, showcasing his expertise in developing advanced measurement techniques. He has 1 patent to his name.

Career Highlights

Wang is affiliated with the Beijing Aerospace Institute for Metrology and Measurement Technology. His role at this prestigious institution allows him to work on cutting-edge technologies that have practical applications in various fields.

Collaborations

Chunxi Wang collaborates with talented individuals such as Kun Xiong and Yinxiao Miao. Their combined efforts contribute to the advancement of innovative solutions in their respective areas of expertise.

Conclusion

Chunxi Wang's contributions to the field of measurement technology exemplify the spirit of innovation. His work continues to influence advancements in orientation methods, making a lasting impact in the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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