Singapore, Singapore

Chunlin Luke Zeng



 

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2013

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1 patent (USPTO):Explore Patents

Title: The Innovations of Chunlin Luke Zeng

Introduction

Chunlin Luke Zeng is a notable inventor based in Singapore, recognized for his contributions to the field of semiconductor technology. He holds a patent that showcases his innovative approach to defect inspection in semiconductor devices. His work has significant implications for the efficiency and accuracy of semiconductor manufacturing processes.

Latest Patents

Chunlin Luke Zeng's most recent patent is titled "Patterned Wafer Defect Inspection System and Method." This patent describes a sophisticated system designed for inspecting semiconductor devices. The system includes a region system that selects multiple regions from a semiconductor wafer. A golden template system generates a region golden template for each region, allowing a die image to be compared to golden templates from various regions. Additionally, a group golden template system creates multiple group golden templates from the region golden templates, facilitating comparisons of die images to templates from several group golden templates. This innovative approach enhances the accuracy of defect detection in semiconductor manufacturing.

Career Highlights

Throughout his career, Chunlin Luke Zeng has worked with prominent companies in the semiconductor industry. He has been associated with Asti Holdings Limited and Semiconductor Technologies & Instruments Pte. Ltd. His experience in these organizations has contributed to his expertise in semiconductor technology and innovation.

Collaborations

Chunlin Luke Zeng has collaborated with several professionals in his field, including Ajharali Amanullah and Lin Jing. These collaborations have likely enriched his work and contributed to the development of his innovative solutions.

Conclusion

Chunlin Luke Zeng is a distinguished inventor whose work in semiconductor technology has led to significant advancements in defect inspection systems. His patent reflects a commitment to improving manufacturing processes in the semiconductor industry. His contributions continue to influence the field and inspire future innovations.

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