Daejeon, South Korea

Chung-Seog Oh


Average Co-Inventor Count = 7.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2007

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1 patent (USPTO):Explore Patents

Title: Innovations of Chung-Seog Oh in Atomic Force Microscopy

Introduction

Chung-Seog Oh is a prominent inventor based in Daejeon, South Korea. He has made significant contributions to the field of atomic force microscopy, particularly with his innovative designs that enhance the functionality of these instruments. His work is recognized for its practical applications in various scientific and industrial fields.

Latest Patents

Chung-Seog Oh holds a patent for an atomic force microscope with a probe that features improved tip movement. This invention provides an indentation testing function along an axis, which is crucial for precise measurements. The probe consists of a tip and an arm structure that holds the tip in place. The arm structure is designed with one end mounted on a fixed stage, while the other end is coupled to the AFM tip. Additionally, it includes a hollow frame that is symmetric with respect to a plane that includes the axis on which the two ends are positioned. This innovative design enhances the performance and accuracy of atomic force microscopy.

Career Highlights

Chung-Seog Oh is affiliated with the Korea Institute of Machinery & Materials, where he continues to advance research in the field of microscopy. His dedication to innovation has led to the development of technologies that improve measurement techniques and broaden the applications of atomic force microscopy.

Collaborations

Chung-Seog Oh has collaborated with notable colleagues, including Hak-Joo Lee and Jae-Hyun Kim. These partnerships have fostered a collaborative environment that encourages the exchange of ideas and expertise, further enhancing the impact of their research.

Conclusion

Chung-Seog Oh's contributions to atomic force microscopy exemplify the importance of innovation in scientific research. His patented designs not only improve measurement techniques but also pave the way for future advancements in the field. His work continues to inspire and influence the next generation of inventors and researchers.

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