The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 24, 2007
Filed:
Jun. 19, 2006
Hak-joo Lee, Daejeon, KR;
Jae-hyun Kim, Daejeon, KR;
Chung-seog OH, Daejeon, KR;
Seung-woo Han, Daejeon, KR;
Shin Hur, Daejeon, KR;
Soon-gyu Ko, Daejeon, KR;
Byung-ik Choi, Daejeon, KR;
Hak-Joo Lee, Daejeon, KR;
Jae-Hyun Kim, Daejeon, KR;
Chung-Seog Oh, Daejeon, KR;
Seung-Woo Han, Daejeon, KR;
Shin Hur, Daejeon, KR;
Soon-Gyu Ko, Daejeon, KR;
Byung-Ik Choi, Daejeon, KR;
Korea Institute of Machinery & Materials, Daejeon, KR;
Abstract
An atomic force microscope probe provides an indentation testing function in a direction along an axis. The probe has a tip and an arm structure holding the tip. The arm structure has one end mounted on a fixed stage, the other end coupled to the AFM tip, and a hollow frame having a shape symmetric with respect to a plane including an axis on which the two ends are positioned.