Shenzhen, China

Chun-Ying Wang

This inventor holds 2 USPTO granted patents. Top assignees: Fih (Hong Kong) Limited, Shenzhen Futaihong Precision Industry Co., Ltd.. Active years: 2009-2011.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Chun-Ying Wang. Retrieved from https://idiyas.com/inventor/chun-ying-wang-vogk3yn4

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 7.2

ph-index = 1


Company Filing History:


Years Active: 2009-2011

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2 patents (USPTO):Explore Patents

Title: **Chun-Ying Wang: Innovator in Electronic Device Testing**

Introduction

Chun-Ying Wang is a notable inventor based in Shenzhen, China, recognized for his contributions to the field of electronic device testing. With a total of two patents to his name, Wang has demonstrated a commitment to enhancing the reliability and performance of electronic devices through innovative testing apparatuses.

Latest Patents

Wang's latest patents reflect his ingenuity in creating advanced testing solutions. The first patent titled "Fatigue Test Apparatus for Thin Element of Electronic Device" introduces a comprehensive setup for evaluating the durability of thin workpieces. This apparatus consists of a supporting module, a driving mechanism, and a computer system that orchestrates the testing process by controlling the rotation of holding posts.

The second patent, "Test Apparatus and Method Therewith," focuses on assessing the separation force between a housing and a subsidiary element of portable electronic devices. Featuring a positioning apparatus, push mechanism, and test machine, this invention allows for precise measurements necessary to ensure the integrity of electronic components.

Career Highlights

Chun-Ying Wang has built an impressive career within leading companies in the industry. He has worked with Shenzhen Futaihong Precision Industry Co., Ltd. and FIH (Hong Kong) Limited, honing his skills as an innovator in electronic device technology. His experience in these roles has greatly contributed to his understanding and advancement of testing apparatus designs.

Collaborations

Throughout his career, Wang has collaborated with notable colleagues such as Lei Li and Ping Chen. These partnerships have fostered an environment of shared knowledge and innovation, further enhancing the quality and scope of their collective work in the field of electronic device testing.

Conclusion

Chun-Ying Wang’s contributions through his patents are pivotal in the ongoing evolution of electronic devices. His innovative testing solutions not only provide critical insights into product durability but also help elevate the standards of quality in the electronics industry. As technology continues to advance, inventors like Wang remain essential to pushing the boundaries of what is possible.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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