Company Filing History:
Years Active: 2015
Title: Innovations by Chun-Yen Ho in Semiconductor Inspection Technology.
Introduction
Chun-Yen Ho is a notable inventor based in Changhua County, Taiwan. He has made significant contributions to the field of semiconductor technology, particularly in defect inspection methods. His innovative approach has led to the development of a unique apparatus that enhances the efficiency of semiconductor inspections.
Latest Patents
Chun-Yen Ho holds a patent for a "Defect inspection apparatus and method." This apparatus includes a stage that supports a semiconductor element with multiple complete and partial dies. A photosensitive element is positioned above the stage, and a controller is electrically connected to the photosensitive element. This setup allows for the effective inspection of defects in both complete and partial dies, showcasing his ingenuity in improving semiconductor manufacturing processes. He has 1 patent to his name.
Career Highlights
Chun-Yen Ho is currently employed at Taiwan Semiconductor Manufacturing Company Limited, a leading firm in the semiconductor industry. His work at this prestigious company has allowed him to apply his innovative ideas in a practical setting, contributing to advancements in semiconductor technology.
Collaborations
Chun-Yen Ho has collaborated with talented individuals such as Tsung-Hsien Lee and Han-Tang Lo. These collaborations have fostered a creative environment that encourages the development of cutting-edge technologies in the semiconductor field.
Conclusion
Chun-Yen Ho's contributions to semiconductor inspection technology exemplify the impact of innovation in the industry. His patent for a defect inspection apparatus highlights his commitment to enhancing manufacturing processes. His work continues to influence the field, paving the way for future advancements.