Incheon, South Korea

Chun Woo Kim

This inventor holds 1 USPTO granted patent. Top assignee: Lg Electronics Inc.. Active years: 2000.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Chun Woo Kim. Retrieved from https://idiyas.com/inventor/chun-woo-kim

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2000

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1 patent (USPTO):Explore Patents

Title: Innovations by Chun Woo Kim

Introduction

Chun Woo Kim is a notable inventor based in Incheon, South Korea. He has made significant contributions to the field of image processing through his innovative patent. His work focuses on enhancing the quality of image signals, particularly in the transformation of gray image signals into binary image signals.

Latest Patents

Chun Woo Kim holds a patent for a "Non-casual error diffusion method and apparatus." This technique is designed to prevent the occurrence of visible correlated patterns and artifacts when converting gray image signals. The non-causal error diffusion method reflects transformation errors to pixels at non-causal locations, ensuring a more accurate representation of the image.

Career Highlights

Chun Woo Kim is associated with LG Electronics Inc., a leading company in the electronics industry. His role at LG Electronics has allowed him to work on cutting-edge technologies that push the boundaries of image processing.

Collaborations

He collaborates with talented individuals such as Seung Woo Kang and Hyun Jung Shin, who contribute to the innovative projects at LG Electronics.

Conclusion

Chun Woo Kim's contributions to image processing through his patented technology exemplify the importance of innovation in the electronics industry. His work continues to influence advancements in how we perceive and process images.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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