Hsinchu, Taiwan

Chun-Wei Lee

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: National Tsing Hua University. Active years: 2017.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Chun-Wei Lee. Retrieved from https://idiyas.com/inventor/chun-wei-lee-uvozwnwm

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2017

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1 patent (USPTO):Explore Patents

Title: Innovations of Chun-Wei Lee

Introduction

Chun-Wei Lee is a notable inventor based in Hsinchu, Taiwan. He has made significant contributions to the field of detection devices through his innovative manufacturing methods. His work is recognized for its potential applications in various technological advancements.

Latest Patents

Chun-Wei Lee holds a patent for a "Manufacturing method for detection device and detection device manufactured therefrom." This patent describes a method for manufacturing a detection device that involves dispensing a plurality of reagent droplets of a detection reagent onto a fiber substrate. The fiber substrate absorbs these droplets to form a detection device with at least one detection pore. The dispensing unit consists of two plastic sheets and a water retention substrate, which contains the detection reagent, with one of the plastic sheets featuring at least one opening.

Career Highlights

Chun-Wei Lee is affiliated with National Tsing Hua University, where he continues to engage in research and development. His work has garnered attention for its innovative approach to detection technology.

Collaborations

Chun-Wei Lee has collaborated with notable colleagues, including Shueh-Yao Chu and Chao-Min Cheng. Their combined expertise contributes to the advancement of research in their field.

Conclusion

Chun-Wei Lee's contributions to the field of detection devices highlight his innovative spirit and dedication to advancing technology. His patent reflects a significant step forward in manufacturing methods, showcasing the potential for future developments in this area.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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