BAYAN LEPAS, Malaysia

Chun Wei Lee

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Skyechip Berhad. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Chun Wei Lee. Retrieved from https://idiyas.com/inventor/chun-wei-lee-m7muheyk

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Chun Wei Lee and Low-Dropout Regulator Protection

Introduction

Chun Wei Lee is an inventor based in Bayan Lepas, Malaysia. His patent work addresses power regulation and overvoltage protection, and he is associated with Skyechip Berhad.

Latest Patents

Lee is credited with 1 patent: “Circuitry for Low-Dropout Regulator with Overvoltage Protection Circuit.” The invention describes a power-up process that detects high- and medium-voltage levels and applies different bias mechanisms for each. During high-voltage startup, an overvoltage protection circuit helps adjust the bias voltage for the feedback system. When medium voltage is detected, the circuit is turned off and a fixed voltage reference is applied to the pass gate, supporting rapid startup.

Career Highlights

Lee’s listed patent reflects work on low-dropout regulator circuitry, with a focus on managing voltage transitions and protecting the regulator during startup. He is associated with Skyechip Berhad.

Collaborations

Lee’s listed coworker is Jaw Wen Chew. The available information identifies the coworker but does not specify their role in the patent.

Conclusion

Chun Wei Lee’s patent focuses on improving low-dropout regulator startup through voltage-sensitive bias control and overvoltage protection.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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