Chun-teng Chen

Title: Innovations of Chun-teng Chen

Introduction

Chun-teng Chen is a notable inventor based in Hsinchu, Taiwan. He has made significant contributions to the field of semiconductor technology. His work has led to the development of innovative testing methods that enhance the efficiency of electronic devices.

Latest Patents

Chun-teng Chen holds a patent for a "Test circuit and test method." This patent describes a test circuit that includes a scan chain and a wrapper chain. The wrapper chain shifts in a test pattern according to a first clock. The scan chain is coupled to the wrapper chain via a logic combination of a circuit under test. The wrapper chain is configured to transmit the test pattern to the scan chain via the logic combination according to a second clock in a capture phase. The wrapper chain includes a first and a second wrapper cell, along with an asynchronous register. The first wrapper cell sequentially shifts in two bits of the test pattern in the shift-in phase. The second wrapper cell shifts in the first bit of the test pattern in the shift-in phase. The asynchronous register conducts the first wrapper cell to the second wrapper cell in the shift-in phase and latches the second wrapper cell in the capture phase. Chun-teng Chen has 1 patent to his name.

Career Highlights

Chun-teng Chen is currently employed at Realtek Semiconductor Inc., where he continues to innovate in the semiconductor industry. His work focuses on improving testing methodologies for electronic components, which is crucial for ensuring product reliability and performance.

Collaborations

Chun-teng Chen collaborates with Po-Lin Chen, contributing to advancements in their field through shared expertise and innovative ideas.

Conclusion

Chun-teng Chen's contributions to semiconductor technology and his innovative patent demonstrate his commitment to enhancing electronic testing methods. His work continues to impact the industry positively.