San Jose, CA, United States of America

Chun Sum Yueng


Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2022-2023

Loading Chart...
2 patents (USPTO):Explore Patents

Title: Innovations by Chun Sum Yueng

Introduction

Chun Sum Yueng is an accomplished inventor based in San Jose, CA. He has made significant contributions to the field of memory technology, holding a total of 2 patents. His work focuses on enhancing data reliability and error recovery operations within memory systems.

Latest Patents

Chun Sum Yueng's latest patents include innovative methods for error recovery operations. One patent describes a method that determines whether a data reliability parameter associated with a set of memory cells exceeds a threshold. If it does, the method performs an error recovery operation. Following this, it assesses whether the data reliability parameter falls below the threshold and, if so, sets an offset related to the error recovery operation as the default read voltage for the memory cells. Another patent elaborates on similar error recovery operations within a memory sub-system, emphasizing the importance of maintaining data integrity.

Career Highlights

Chun Sum Yueng is currently employed at Micron Technology Incorporated, a leading company in the semiconductor industry. His expertise in memory technology has positioned him as a valuable asset to the organization. His innovative approaches to error recovery have the potential to significantly improve the performance and reliability of memory systems.

Collaborations

Chun Sum Yueng collaborates with talented individuals such as Guang Hu and Ting Luo, who contribute to the advancement of technology in their respective fields. Their teamwork fosters an environment of innovation and creativity.

Conclusion

Chun Sum Yueng's contributions to memory technology through his patents and work at Micron Technology Incorporated highlight his role as a key innovator in the industry. His focus on error recovery operations is crucial for enhancing data reliability in modern memory systems.

This text is generated by artificial intelligence and may not be accurate.
Please report any incorrect information to support@idiyas.com
Loading…