Tainan, Taiwan

Chun-Ren Ke

This inventor holds 3 USPTO granted patents and 1 published patent application. Top assignee: National Cheng-Kung University. Active years: 2014-2017.

USPTO Granted Patents = 3 

% Patents Active = 33.3

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2014-2017

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3 patents (USPTO):Explore Patents

Title: Innovations of Chun-Ren Ke

Introduction

Chun-Ren Ke is a notable inventor based in Tainan, Taiwan. He has made significant contributions to the field of materials science, particularly in the development of photoelectrodes and mesoporous titania beads. With a total of 3 patents to his name, his work is recognized for its innovative approaches and practical applications.

Latest Patents

Chun-Ren Ke's latest patents include a photoelectrode and a method for preparing the same. This invention relates to a photoelectrode that comprises a substrate and a titania layer made of a mesoporous titania bead. The bead has a diameter ranging from 200-1000 nm, a specific surface area of 50-100 m/g, porosity of 40-60%, pore radius of 5-20 nm, and a pore volume of 0.20-0.30 cm/g. The titania in the bead is specifically anatase titania. Another significant patent is for a mesoporous titania bead and its preparation method, which shares similar specifications regarding size and properties.

Career Highlights

Chun-Ren Ke is affiliated with National Cheng Kung University, where he engages in research and development activities. His academic background and research focus have positioned him as a key figure in his field.

Collaborations

Chun-Ren Ke collaborates with various professionals, including his coworker Jyh-Ming Ting, to advance his research and innovations.

Conclusion

Chun-Ren Ke's contributions to the field of materials science through his patents and collaborations highlight his role as an influential inventor. His work continues to impact the development of advanced materials and technologies.

Profile summary based on public USPTO records.
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