Hong Kong, China

Chun Kwong Yeung

This inventor holds 2 USPTO granted patents. Top assignee: Nano and Advanced Materials Institute Limited. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Chun Kwong Yeung. Retrieved from https://idiyas.com/inventor/chun-kwong-yeung

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2026

Loading Chart...
2 patents (USPTO):Explore Patents

Title: The Innovations of Chun Kwong Yeung

Introduction

Chun Kwong Yeung is a notable inventor based in Hong Kong, CN. He has made significant contributions to the field of materials science, particularly in the development of photopolymers. His innovative work has led to the creation of a unique photopolymer that addresses critical challenges in various applications.

Latest Patents

Chun Kwong Yeung holds a patent for a photopolymer designed for anti-yellowing and anti-thermal cracking applications. This acrylate-based photopolymer exhibits high yellowing resistance, excellent photo sensitivity, high toughness, and a high glass transition temperature. The patent also details methods of preparation and usage, as well as solders that incorporate this advanced material.

Career Highlights

Chun Kwong Yeung is associated with the Nano and Advanced Materials Institute Limited, where he continues to push the boundaries of material innovation. His work has garnered attention for its practical applications and potential impact on various industries.

Collaborations

Chun has collaborated with talented individuals such as Liang Zhang and Kin Cheung Chan, contributing to a dynamic research environment that fosters innovation.

Conclusion

Chun Kwong Yeung's contributions to the field of photopolymers exemplify the spirit of innovation. His work not only addresses current challenges but also paves the way for future advancements in materials science.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…