Wuxi, China

Chun Hua

This inventor holds 1 USPTO granted patent and 5 published patent applications. Top assignee: Crm Icbg (Wuxi) Co., Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Chun Hua. Retrieved from https://idiyas.com/inventor/chun-hua

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Chun Hua and Memory Control Innovation

Introduction

Chun Hua is an inventor associated with Wuxi, China. His patent work addresses memory control, testing, and system efficiency. The available information lists 1 patent and identifies Crm Icbg (Wuxi) Co., Ltd. as his company.

Latest Patents

His listed patent, “Memory Control System and Method,” describes a memory with a main storage module and a built-in EEPROM, alongside a storage controller and processor. In normal mode, the controller reads programs from the main storage module and manages read-write operations for the EEPROM. In test mode, it controls read-write operations on either memory component according to a test control signal, or performs a self-test.

The patent describes reducing resource consumption by omitting hardware logic for reading after dormancy and shortening dormancy and wake-up time. It also uses one counter and one timing control unit to manage timing across the system.

Career Highlights

Chun Hua’s listed invention focuses on practical improvements to memory-system control, including test functionality and more efficient timing management. He is associated with Crm Icbg (Wuxi) Co., Ltd.

Collaborations

The provided information names Jun Sun and Tianping Shen as Chun Hua’s coworkers. It does not specify their roles in the patent or describe particular collaborations.

Conclusion

Chun Hua’s listed patent presents a memory control approach designed to support testing while reducing system resource use and dormancy-related delays.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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