Chun-Hsi Li

Title: Innovations of Chun-Hsi Li in Memory Device Testing

Introduction

Chun-Hsi Li is a notable inventor based in New Taipei, Taiwan. He has made significant contributions to the field of memory device testing, showcasing his expertise through his innovative patent.

Latest Patents

Chun-Hsi Li holds a patent for a "Test apparatus and test method to a memory device." This patent describes a test system that includes a tester, a first voltage stabilization circuit, and a device under test (DUT). The tester generates a first operational voltage and a control signal. The first voltage stabilization circuit transmits a second operational voltage, associated with the first operational voltage, to a socket board. The DUT operates with the second operational voltage received through the socket board. Additionally, the first voltage stabilization circuit is configured to control, according to the control signal, the second operational voltage to have a first voltage level when the DUT is operating.

Career Highlights

Chun-Hsi Li is currently employed at Nan Ya Technology Corporation, where he applies his skills and knowledge in the development of advanced testing systems. His work has contributed to the enhancement of memory device performance and reliability.

Collaborations

Chun-Hsi Li collaborates with talented coworkers, including Yu-Wei Tseng and Chih-Ming Chang, who share his commitment to innovation in technology.

Conclusion

Chun-Hsi Li's contributions to memory device testing through his patent demonstrate his innovative spirit and dedication to advancing technology. His work at Nan Ya Technology Corporation continues to impact the industry positively.