Gwangju, South Korea

Chun He Zheng

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Sstlabs. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Chun He Zheng. Retrieved from https://idiyas.com/inventor/chun-he-zheng

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: The Innovations of Chun He Zheng

Introduction

Chun He Zheng is a notable inventor based in Gwangju, South Korea. He has made significant contributions to the field of medical imaging technology. His work focuses on enhancing the capabilities of computed tomography scanning devices.

Latest Patents

Chun He Zheng holds a patent for a computed tomography scanning device. This innovation aims to improve the efficiency and accuracy of medical imaging, providing better diagnostic tools for healthcare professionals. He has 1 patent to his name, showcasing his commitment to advancing technology in this critical area.

Career Highlights

Chun He Zheng is currently employed at Sstlabs, where he continues to develop innovative solutions in medical imaging. His role at the company allows him to collaborate with other experts in the field, further enhancing his contributions to technology.

Collaborations

Chun He Zheng works alongside Kwang Hee Nam, a fellow innovator at Sstlabs. Their collaboration focuses on pushing the boundaries of medical imaging technology, ensuring that they remain at the forefront of innovation.

Conclusion

Chun He Zheng's work in computed tomography scanning devices exemplifies the impact of innovation in healthcare. His contributions are vital for improving diagnostic capabilities and enhancing patient care.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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