SuZhou, China

Chun He

This inventor holds 1 USPTO granted patent. Top assignee: Qisda Corporation. Active years: 2009.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Chun He. Retrieved from https://idiyas.com/inventor/chun-he-orsx6tbg

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 6(Granted Patents)


Company Filing History:


Years Active: 2009

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1 patent (USPTO):Explore Patents

Title: The Innovations of Chun He

Introduction

Chun He is an accomplished inventor based in Su Chou, China. He has made significant contributions to the field of imaging technology, particularly with his innovative scanner design. His work has garnered attention for its practical applications and technical advancements.

Latest Patents

Chun He holds a patent for a scanner that includes a contact image sensor module and an elasticity-providing element. This design addresses the issue of vertical shift in the contact image sensor module caused by mechanical friction or other unexpected factors. As a result, the scanner is capable of retrieving clear images consistently, enhancing the overall user experience.

Career Highlights

Chun He is currently employed at Qisda Corporation, where he continues to develop and refine imaging technologies. His expertise in this area has positioned him as a valuable asset to the company and the industry at large.

Collaborations

Chun He has worked alongside talented colleagues, including Min-Wen Hong and Tsung-Te Lin. Their collaborative efforts have contributed to the advancement of technology within their field.

Conclusion

Chun He's innovative contributions to scanner technology exemplify the impact of dedicated inventors in the realm of imaging solutions. His work not only enhances the functionality of scanners but also sets a standard for future developments in the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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