Yokohama, Japan

Chuji Katayama

This inventor holds 1 USPTO granted patent. Top assignee: Bruker Axs K.k.. Active years: 2006.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Chuji Katayama. Retrieved from https://idiyas.com/inventor/chuji-katayama-nq1jv604

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2006

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1 patent (USPTO):Explore Patents

Title: Innovations of Chuji Katayama in X-ray Technology.

Introduction

Chuji Katayama is a notable inventor based in Yokohama, Japan. He has made significant contributions to the field of X-ray technology, particularly with his innovative designs that enhance the functionality of X-ray generators. His work is characterized by a focus on improving the precision and efficiency of X-ray emission.

Latest Patents

Katayama holds a patent for an X-ray generator and an adjusting method of the same. This invention addresses the challenge of differences in emitting directions by switching the types of X-rays. The X-ray generator comprises an anticathode unit with multiple anticathode parts that emit X-rays through the collision of thermoelectrons. It also includes a cathode that releases thermoelectrons toward these anticathode parts and a moving mechanism that allows for the switching of anticathode parts. An optical element is integrated to emit incident X-rays as diffracted X-rays, along with an adjustment mechanism that aligns the emitting directions of the diffracted X-rays.

Career Highlights

Katayama is currently associated with Bruker AXS K.K., where he continues to develop and refine technologies related to X-ray generation. His expertise in this area has positioned him as a key figure in advancing X-ray technology.

Conclusion

Chuji Katayama's innovative work in X-ray technology exemplifies the importance of continuous improvement in scientific instruments. His patent reflects a significant advancement in the field, showcasing his dedication to enhancing the precision of X-ray emission.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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