Daejeon, South Korea

Chui Hee Lee

This inventor holds 1 USPTO granted patent. Top assignee: Kallion, Inc.. Active years: 2021.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Chui Hee Lee. Retrieved from https://idiyas.com/inventor/chui-hee-lee

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2021

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Innovations by Chui Hee Lee: A Pioneer in 3D Document Scanning Technology

Introduction

Chui Hee Lee is an innovative inventor based in Daejeon, South Korea. He has made significant contributions to the field of document scanning technology. His work focuses on creating portable solutions that enhance the efficiency and accuracy of document capture.

Latest Patents

Chui Hee Lee holds a patent for a Portable 3D Document Scanning Device and Method. This invention includes a projector that projects light in a predetermined pattern onto a document. It also features a 3D scanning camera that captures both the pattern of the light and the document itself. The control unit estimates the size and shape of the captured document based on the image data and the projected light pattern. This innovative approach allows for precise corrections to the image data, making it a valuable tool in various applications.

Career Highlights

Chui Hee Lee is currently associated with Kallion, Inc., where he continues to develop cutting-edge technologies. His expertise in 3D scanning has positioned him as a key player in the industry. His work not only showcases his technical skills but also his commitment to advancing document scanning technology.

Collaborations

(Section skipped due to space constraints.)

Conclusion

Chui Hee Lee's contributions to the field of 3D document scanning exemplify the spirit of innovation. His patented technology represents a significant advancement in how documents are captured and processed.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…